Re: [PATCH v4 3/7] binman: Fix FIT image overlap issues for testFitSplitElf

On 2026-07-31T00:13:34, Aristo Chen <[email protected]> wrote:
> binman: Fix FIT image overlap issues for testFitSplitElf
>
> testFitSplitElf builds both the ATF and TEE test images from the same
> elf_sections binary, so the split-elf nodes generated for the two
> images end up with identical load addresses and overlap in memory. An
> upcoming commit teaches mkimage to validate whether the memory
> regions referenced by a configuration overlap, which makes this test
> fail.
>
> Update the test to use a non-overlapping memory layout so the two
> images no longer collide:
>
> 1. Add elf_sections_tee.lds, which mirrors elf_sections.lds with the
>    section addresses shifted up by 0x100000 for the TEE image.
> 2. Build an elf_sections_tee binary from it in the test Makefile.
> 3. Update ftest.py to use the separate ELF file for the TEE component
>    in split-elf operations.
>
> Signed-off-by: Aristo Chen <[email protected]>
>
> tools/binman/ftest.py                  |  2 +-
>  tools/binman/test/Makefile             |  8 ++++++--
>  tools/binman/test/elf_sections_tee.c   |  1 +
>  tools/binman/test/elf_sections_tee.lds | 35 ++++++++++++++++++++++++++++++++++
>  4 files changed, 43 insertions(+), 3 deletions(-)

Reviewed-by: Simon Glass <[email protected]>