[gcc r17-2454] testsuite, aarch64: Drop duplication of big endian AArch64 neon tests.

Iain D Sandoe via Gcc-cvs <[email protected]>
Newsgroups gmane.comp.gcc.cvs
Message-ID <[email protected]>
https://gcc.gnu.org/g:a0f7c857279aa4f2830b65813b9ed68d9fa9098d

commit r17-2454-ga0f7c857279aa4f2830b65813b9ed68d9fa9098d
Author: Iain Sandoe <[email protected]>
Date:   Thu Jul 16 09:42:37 2026 +0100

    testsuite, aarch64: Drop duplication of big endian AArch64 neon tests.
    
    The aarch64-neon driver script includes a section that allows for a
    target to perform the tests as big-endian.  Since the majority of LE
    targets will not be able to perform these tests this produces a lot
    of UNRESOLVED cases there.  For big-endian targets the effect is to
    do the work twice.
    
    So removing that section.
    
    gcc/testsuite/ChangeLog:
    
            * gcc.target/aarch64/neon/aarch64-neon.exp: Remove section
            re-runing the tests as big-endian.
    
    Signed-off-by: Iain Sandoe <[email protected]>

Diff:
---
 gcc/testsuite/gcc.target/aarch64/neon/aarch64-neon.exp | 4 ----
 1 file changed, 4 deletions(-)

diff --git a/gcc/testsuite/gcc.target/aarch64/neon/aarch64-neon.exp b/gcc/testsuite/gcc.target/aarch64/neon/aarch64-neon.exp
index e3a48b306a50..92b50d9b5c76 100644
--- a/gcc/testsuite/gcc.target/aarch64/neon/aarch64-neon.exp
+++ b/gcc/testsuite/gcc.target/aarch64/neon/aarch64-neon.exp
@@ -35,9 +35,5 @@ dg-init
 dg-runtest [lsort [glob -nocomplain $srcdir/$subdir/*\[cCs\]]] \
 	" -ansi -pedantic-errors -std=c23 -O2 -march=armv8-a+simd" ""
 
-# Again, for big-endian targets.
-dg-runtest [lsort [glob -nocomplain $srcdir/$subdir/*\[cCs\]]] \
-	" -ansi -pedantic-errors -std=c23 -O2 -march=armv8-a+simd -mbig-endian" ""
-
 # All done.
 dg-finish
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