Re: [PATCH v2] selftests/mm: Drop duplicate test_seal_mprotect_two_vma_with_gap() call

> > ---
> > v2:
> > - update ksft_set_plan(88) to 87 to match the actual number of tests
> >   after removing the duplicate call.
> 
> I wonder if there could be an automated way for this.  Obviously not a question
> to the author but just my loud thought.

Glad you brought this up, I totally agree with your thought.

Something like the below refactor could achieve that automation:

+typedef void (*test_fn)(void);
+typedef void (*test_fn_seal)(bool seal);
+
+static const struct {
+    test_fn_seal fn;
+    bool seal;
+} tests_seal[] = {
+    { test_seal_mprotect, false },
+    { test_seal_mprotect, true },
...
+};
+
+static const test_fn tests[] = {
+    test_seal_addseal,
+    test_seal_unmapped_start,
...
+};
+
+
 int main(void)
 {
...
-       ksft_set_plan(87);
+       ksft_set_plan(ARRAY_SIZE(tests) + ARRAY_SIZE(tests_seal));
+       for (size_t i = 0; i < ARRAY_SIZE(tests); i++)
+               tests[i]();
+       for (size_t i = 0; i < ARRAY_SIZE(tests_seal); i++)
+        tests_seal[i].fn(tests_seal[i].seal);

Though I'm still unsure whether this extra complexity is really worthwhile.