Re: [Automated-testing] KCIDB: Test schema enhancements

On 8/5/24 3:28 PM, Nikolai Kondrashov wrote:
> On 8/5/24 12:56 PM, Nikolai Kondrashov wrote:
>> Meanwhile I'd like to propose two small, but potentially very useful changes
>> to the I/O schema for tests:
>>
>> * Supporting non-binary outputs beyond PASS/FAIL -
>>   integers/floats/booleans/strings/etc. - useful for performance tests.
>>
>> * Supporting recording `compatible` values from the top of the device tree
>>   inside the test environment, for machines which use them - useful for
>>   correlating test results by hardware.
>>
>> Here's the corresponding schema PR:
>>
>>     https://github.com/kernelci/kcidb-io/pull/85
>>
>> I'll follow up with a separate message for each of the changes, going over the
>> details and the rationale.
> 
> The "compatible" property in the root of a device tree specifies the device
> vendor, the device (board) model, as well as often the device SoC and family.
> These are generally encoded as several strings, ordered from most to least
> specific, each potentially containing multiple parts separated by commas.
> E.g.:
> 
>     "ti,omap3-beagleboard", "ti,omap3450", "ti,omap3"

Just wanted to highlight, that we also need feedback on this. Thank you!

Nick