[bvanassche:scsi-sdev-printk 1/2] drivers/scsi/scsi_logging_test.c:36:11: warning: diagnostic behavior may be improved by adding the 'format(printf, 3, 0)' attribute to the declaration of 'test_capture_dev_printk'
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tree: https://github.com/bvanassche/linux scsi-sdev-printk head: a31bd03242fd8e9fc6f3b0b5f48ca64bbb6c8f4c commit: 3046a51bbd1826503f7037dd728fa56f87b73c23 [1/2] scsi: core: Add KUnit tests for scsi_logging.c config: arm-randconfig-r072-20260818 (https://download.01.org/0day-ci/archive/20260818/[email protected]/config) compiler: clang version 24.0.0git (https://github.com/llvm/llvm-project 844a18e753e822736c9805ab779144b647a2c186) smatch: v0.5.0-9187-g5189e3fb reproduce (this is a W=1 build): (https://download.01.org/0day-ci/archive/20260818/[email protected]/reproduce) If you fix the issue in a separate patch/commit (i.e. not just a new version of the same patch/commit), kindly add following tags | Reported-by: kernel test robot <[email protected]> | Closes: https://lore.kernel.org/oe-kbuild-all/[email protected]/ All warnings (new ones prefixed by >>): In file included from drivers/scsi/scsi_logging.c:467: >> drivers/scsi/scsi_logging_test.c:36:11: warning: diagnostic behavior may be improved by adding the 'format(printf, 3, 0)' attribute to the declaration of 'test_capture_dev_printk' [-Wmissing-format-attribute] 28 | static void test_capture_dev_printk(const char *level, const struct device *dev, | __attribute__((format(printf, 3, 0))) 29 | const char *fmt, va_list args) 30 | { 31 | if (captured_count < MAX_CAPTURED_LINES) { 32 | captured_logs[captured_count].level = level; 33 | captured_logs[captured_count].dev = dev; 34 | vscnprintf(captured_logs[captured_count].msg, 35 | sizeof(captured_logs[captured_count].msg), fmt, 36 | args); | ^ drivers/scsi/scsi_logging_test.c:28:13: note: 'test_capture_dev_printk' declared here 28 | static void test_capture_dev_printk(const char *level, const struct device *dev, | ^ 1 warning generated. vim +36 drivers/scsi/scsi_logging_test.c 27 28 static void test_capture_dev_printk(const char *level, const struct device *dev, 29 const char *fmt, va_list args) 30 { 31 if (captured_count < MAX_CAPTURED_LINES) { 32 captured_logs[captured_count].level = level; 33 captured_logs[captured_count].dev = dev; 34 vscnprintf(captured_logs[captured_count].msg, 35 sizeof(captured_logs[captured_count].msg), fmt, > 36 args); 37 captured_count++; 38 } 39 } 40 -- 0-DAY CI Kernel Test Service https://github.com/intel/lkp-tests/wiki