Re: [PATCH] formalize and fix disabling the RT subvolume
"Darrick J. Wong" <[email protected]> Wed, 1 Jul 2026 09:51:14 -0700
| Newsgroups | org.kernel.vger.fstests,org.kernel.vger.linux-xfs |
|---|---|
| Message-ID | <20260701165114.GD6517@frogsfrogsfrogs> |
On Wed, Jul 01, 2026 at 12:54:07PM +0200, Christoph Hellwig wrote: > On Tue, Jun 30, 2026 at 11:40:18AM -0700, Darrick J. Wong wrote: > > On Tue, Jun 30, 2026 at 01:35:26PM +0200, Christoph Hellwig wrote: > > > Various test unset SCRATCH_RTDEV to avoid dealing with metadata > > > allocations for the RT subvolume in the main device or differences > > > in RT subvolume behavior. Besides being rather ad-hoc, this unset > > > also fails to disable the internal RT zoned subvolume. > > > > > > Add a _disable_scratch_realtime helper that not only unsets > > > SCRATCH_RTDEV, but also disables the zoned allocator and with > > > that the internal RT subvolume. > > > > What if we want to run these tests on the internal rt volume? > > Then we need to stop disabling the RT volume for them.. Ahaha ok with this patch applied, the regressions I see in generic/441 and xfs/656 go away. generic/441 chokes because the scratch fs goes down due to writeback error, so I assume it's ok to start excluding this test. xfs/656 is a different story: --- /run/fstests/bin/tests/xfs/656.out 2026-03-13 16:19:08.152939212 -0700 +++ /run/fstests/logs/xfs/656.out.bad 2026-06-30 18:16:43.847849604 -0700 @@ -1,10 +1,9 @@ QA output created by 656 Format and mount pwrite: Input/output error -pread: Input/output error +stat: Input/output error pread: Input/output error fsync: Input/output error VICTIM pos NUM len NUM: directio_write: Input/output error -VICTIM pos NUM len NUM: directio_read: Input/output error VICTIM pos NUM len NUM: buffered_read: Input/output error VICTIM pos NUM len NUM: buffered_write: Input/output error I'm guessing that the write failure takes down the filesystem, which is why the subsequent xfs_io pread can't even open the file. Also the comment in xfs/655 and 656 doesn't make sense: # Disable the scratch rt device to avoid test failures relating to the # rt bitmap consuming all the free space in our small data device. unset SCRATCH_RTDEV We're creating a regular sized data device, so this shouldn't be an issue. Eh, whatever, I'll clean up those two healer tests. :) Reviewed-by: "Darrick J. Wong" <[email protected]> --D