Re: [PATCH] formalize and fix disabling the RT subvolume
Christoph Hellwig <[email protected]> Thu, 2 Jul 2026 12:33:23 +0200
| Newsgroups | org.kernel.vger.fstests,org.kernel.vger.linux-xfs |
|---|---|
| Message-ID | <[email protected]> |
On Wed, Jul 01, 2026 at 09:51:14AM -0700, Darrick J. Wong wrote: > Ahaha ok with this patch applied, the regressions I see in generic/441 > and xfs/656 go away. generic/441 chokes because the scratch fs goes > down due to writeback error, so I assume it's ok to start excluding this > test. There also is a dedicated patch disabling them for zoned on the list": "common: skip data write EIO survival tests on fatal configs" from Yao Sang. > I'm guessing that the write failure takes down the filesystem, which is > why the subsequent xfs_io pread can't even open the file. Yes. > > Also the comment in xfs/655 and 656 doesn't make sense: > > # Disable the scratch rt device to avoid test failures relating to the > # rt bitmap consuming all the free space in our small data device. > unset SCRATCH_RTDEV > > We're creating a regular sized data device, so this shouldn't be an > issue. I think this has been copy and pasted with the unsetting of SCRATCH_RTDEV, as several tests have it..