Re: [PATCH] formalize and fix disabling the RT subvolume
"Darrick J. Wong" <[email protected]> Thu, 2 Jul 2026 08:22:29 -0700
| Newsgroups | org.kernel.vger.fstests,org.kernel.vger.linux-xfs |
|---|---|
| Message-ID | <20260702152229.GC9381@frogsfrogsfrogs> |
On Thu, Jul 02, 2026 at 12:33:23PM +0200, Christoph Hellwig wrote: > On Wed, Jul 01, 2026 at 09:51:14AM -0700, Darrick J. Wong wrote: > > Ahaha ok with this patch applied, the regressions I see in generic/441 > > and xfs/656 go away. generic/441 chokes because the scratch fs goes > > down due to writeback error, so I assume it's ok to start excluding this > > test. > > There also is a dedicated patch disabling them for zoned on the list": > > "common: skip data write EIO survival tests on fatal configs" > > from Yao Sang. > > > I'm guessing that the write failure takes down the filesystem, which is > > why the subsequent xfs_io pread can't even open the file. > > Yes. > > > > > Also the comment in xfs/655 and 656 doesn't make sense: > > > > # Disable the scratch rt device to avoid test failures relating to the > > # rt bitmap consuming all the free space in our small data device. > > unset SCRATCH_RTDEV > > > > We're creating a regular sized data device, so this shouldn't be an > > issue. > > I think this has been copy and pasted with the unsetting of SCRATCH_RTDEV, > as several tests have it.. Yes. I apologize for my contributions to the copy-pasta :( --D