Samsung SP2514N showing error: is it genuine?
John Lane <[email protected]>
| Newsgroups | gmane.linux.utilities.smartmontools |
|---|---|
| Message-ID | <[email protected]> |
Hello, I've been using smartctl for a while and my drives are all clean
except one. It shows a single error that I've shown below. I've done
"-a" so you can see all the info.
Is this a real error or due to some Samsung firmware issue? I have tried
-F samsung / samsung2 and samsung3 with no effect - the error is still
there.
I have also run an extended test on the drive and it completed without
error.
Appreciate any advice.
Thanks,
John
$ sudo smartctl -a -l error /dev/sda
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.14.6-1-ARCH] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint P120
Device Model: SAMSUNG SP2514N
Serial Number: S08BJ1RY600160
Firmware Version: VF100-33
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 4a
Local Time is: Thu Jun 19 11:39:15 2014 BST
==> WARNING: May need -F samsung3 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test
routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4929) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 82) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 253 100 051 Pre-fail
Always - 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail
Always - 7360
4 Start_Stop_Count 0x0032 098 098 000 Old_age
Always - 2771
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail
Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail
Offline - 8946
9 Power_On_Hours 0x0032 100 100 000 Old_age
Always - 37284
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail
Always - 0
11 Calibration_Retry_Count 0x0012 253 002 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age
Always - 1510
190 Airflow_Temperature_Cel 0x0022 139 103 000 Old_age
Always - 33
194 Temperature_Celsius 0x0022 139 103 000 Old_age
Always - 33
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age
Always - 7716
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0012 253 253 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age
Always - 0
201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age
Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 30633 hours (1276 days + 9
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 04 47 00 00 e0 Error: ICRC, ABRT 4 sectors at LBA = 0x00000047
= 71
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 04 47 00 00 e0 00 12:45:51.438 READ DMA
c8 00 04 3f 00 00 e0 00 12:45:51.438 READ DMA
c8 00 04 5f 0a 80 e2 00 12:45:51.438 READ DMA
c8 00 04 bf 09 80 e2 00 12:45:51.438 READ DMA
c8 00 08 00 00 00 e0 00 12:45:51.438 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 37282 -
# 2 Short offline Completed without error 00% 37178 -
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever
been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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