Re: ECC support

On 16 September 2015 at 08:51, Bob Bishop <[email protected]> wrote:

<snip>

> - You might think that as memory density increases (ie bit cell size
shrinks), error rates would increase. Apparently this wasn’t so up to 2009
at least, see:
>
>  http://www.cs.toronto.edu/~bianca/papers/sigmetrics09.pdf

subsection 5.1:

"… Figure 6 indicates a trend towards worse error behavior
for increased capacities, although this trend is not consis-
tent. While in some cases the doubling of capacity has a
clear negative effect (factors larger than 1 in the graph),
in others it has hardly any effect (factor close to 1 in the
graph). For example, for Platform A -Mfg1 and Platform F -
Mfg1 doubling the capacity increases uncorrectable errors,
but not correctable errors. Conversely, for Platform D -
Mfg6 doubling the capacity affects correctable errors, but
not uncorrectable error."


There are also other environmental factors which would be more apparent in
"lone-server" configuration vs well maintained and insulated data centres
with very good power conditioning ;-)


-- 
Igor M.
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