Fwd: [eed_2003_vol] ICM 2003

"TaMeR Ashour" <[email protected]> Sat, 06 Sep 2003 20:35:30 +0300
Newsgroups	gmane.org.handasarabia.ofoq
Message-ID	<[email protected]>
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<P><BR><BR></P></DIV><BR><BR><BR>TaMer Ashour 
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>----Original Message Follows---- 
<DIV></DIV>From: "Ramy Ibrahim Omar" <[email protected]>
<DIV></DIV>Reply-To: [email protected] 
<DIV></DIV>To: undisclosed-recipients 
<DIV></DIV>Subject: [eed_2003_vol] ICM 2003 
<DIV></DIV>Date: Sat, 6 Sep 2003 00:23:23 +0300 (Egypt Daylight Time) 
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>The 15th International Conference on Microelectronics 
<DIV></DIV>Dec. 9-11 , 2003 ---------- Cairo , Egypt 
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>Electronics and Communication Department 
<DIV></DIV>Faculty of Engineering, Cairo University 
<DIV></DIV>Giza, Egypt 
<DIV></DIV>Co-Sponsored by Electron Devices society of IEEE 
<DIV></DIV>Scope Microelectronics technology 
<DIV></DIV>Design and applications of integrated circuits and systems 
<DIV></DIV>Computer-Aided-Design for Microelectronics 
<DIV></DIV>
<DIV></DIV>Important Dates 
<DIV></DIV>- Submission of Extended Summary -------- August 15, 2003 Closed 
<DIV></DIV>- Notification of acceptance --------------------- October 1, 2003 
<DIV></DIV>updated 
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>___________________________________________________________________________ 
<DIV></DIV>GENERAL SCOPE: 
<DIV></DIV>MICROELECTRONICS TECHNOLOGY: 
<DIV></DIV>Device characterization and modeling. 
<DIV></DIV>Device physics and novel structures. 
<DIV></DIV>Materials and material characterization techniques. 
<DIV></DIV>Process technology, CMOS, BJT, BiCMOS, GaAs. 
<DIV></DIV>Reliability and failure analysis. 
<DIV></DIV>Radiation effects. 
<DIV></DIV>Packaging, surface mount technology. 
<DIV></DIV>Opto-electronics. 
<DIV></DIV>MEMs and MOEMs Devices. 
<DIV></DIV>Smart power and sensors. 
<DIV></DIV>DESIGN AND APPLICATION OF INTEGRATED CIRCUITS AND SYSTEMS: 
<DIV></DIV>Custom and semi-custom circuits 
<DIV></DIV>(design concepts, architectures and high-performance and low-power circuits) 
<DIV></DIV>
<DIV></DIV>Embedded system design 
<DIV></DIV>Systems on Chip (SoCs) 
<DIV></DIV>Digital signal and data processing. 
<DIV></DIV>Analog circuit techniques. 
<DIV></DIV>Design for testability. 
<DIV></DIV>Low-voltage, low-power VLSI design. 
<DIV></DIV>Applications to computer and telecommunications systems. 
<DIV></DIV>ANN applications. 
<DIV></DIV>Wireless Communication Applications. 
<DIV></DIV>COMPUTER-AIDED DESIGN FOR MICROELECTRONICS: 
<DIV></DIV>Simulation (process, device, circuit, logic, timing, functional). 
<DIV></DIV>Layout (placement, routing, floorplanning, symbolic, ERC, DRC). 
<DIV></DIV>Test (generation, testability, build-in test, simulation). 
<DIV></DIV>Systems (design synthesis, compilation, expert systems, 
<DIV></DIV>tool integration, hardware acceleration, CAD systems). 
<DIV></DIV>Formal verification. 
<DIV></DIV>SUBMISSION OF PAPERS: 
<DIV></DIV>
<DIV></DIV>LANGUAGE: English 
<DIV></DIV>Author(s) should submit extended summaries by August 15, 2003. The summary 
<DIV></DIV>must clearly indicate the area of the papers, the main results and 
<DIV></DIV>contributions. The summary should not exceed four pages, and should strictly 
<DIV></DIV>follow the IEEE journal two-column format. Summaries should be submitted as 
<DIV></DIV>PDF files attached to an Email. Notification of acceptance will be mailed by 
<DIV></DIV>October 1st, 2003. The four pages summary of accepted papers will be 
<DIV></DIV>published in the Conference proceedings, subject to the payment of the 
<DIV></DIV>conference registration fees. The conference Language is English. 
<DIV></DIV>__________________________________________________________________________ 
<DIV></DIV>
<DIV></DIV>Organizing Committee 
<DIV></DIV>General Chair Dr. Serag E.-D. HabibCairo University 
<DIV></DIV>Honorary ChairDr. Mohammed ElSaidAin Shams University 
<DIV></DIV>Local ArrangementsDr. Ihab E. Talkhan 
<DIV></DIV>Dr. Hossam A. H. FahmyCairo University 
<DIV></DIV>Cairo University 
<DIV></DIV>PublicationDr. Ahmed BahnasawiCairo University 
<DIV></DIV>Industrial LiaisonDr. Ahmed Darwish 
<DIV></DIV>Dr. Wael FikryCairo University 
<DIV></DIV>Ain Shams University 
<DIV></DIV>Invited talks and tutorialsDr. Sherif SedkyCairo University 
<DIV></DIV>Financial OfficerDr. Serag E.-D. Habib 
<DIV></DIV>Dr. Ahmed BahnasawiCairo University 
<DIV></DIV>Cairo University 
<DIV></DIV>PublicityDr. Ahmed Hussein 
<DIV></DIV>Dr. Amr Hafez 
<DIV></DIV>Eng. Mohammed BakrCairo University 
<DIV></DIV>Cairo University 
<DIV></DIV>Cairo University 
<DIV></DIV>
<DIV></DIV>Technical Committee 
<DIV></DIV>A. Alamoud Saudi Arabia 
<DIV></DIV>A. Armanazi Syria 
<DIV></DIV>A. Barnett USA 
<DIV></DIV>A. Elraae Saudi Arabia 
<DIV></DIV>A. Mohsen USA 
<DIV></DIV>A. Rashid Egypt 
<DIV></DIV>A. Sharifeddin Malaysia 
<DIV></DIV>A. Turki Tunisia 
<DIV></DIV>A.G. Elden USA 
<DIV></DIV>Abdel Halim M. Shousha Egypt 
<DIV></DIV>AbdEl Halim. Zekry Egypt 
<DIV></DIV>Ahmed El Sherbini Egypt 
<DIV></DIV>Ahmed Soliman Egypt 
<DIV></DIV>Ali E. Salama Egypt 
<DIV></DIV>Ali El Hajj Lebanon 
<DIV></DIV>Amin Nassar Egypt 
<DIV></DIV>Amr Bayoumi Egypt 
<DIV></DIV>Ayman F. Naguib USA 
<DIV></DIV>B. Courtois France 
<DIV></DIV>B. Haron USA 
<DIV></DIV>E. Elmasry Canada 
<DIV></DIV>ElSayed Mostafa Egypt 
<DIV></DIV>F. Gebali Canada 
<DIV></DIV>G. G. Shahidi USA 
<DIV></DIV>George Gad ElKarim USA 
<DIV></DIV>H. De Man Belgium 
<DIV></DIV>Hani Fikry Egypt 
<DIV></DIV>Hassan Elwan USA 
<DIV></DIV>Hisham Haddara Egypt 
<DIV></DIV>Hussein Hanafi USA 
<DIV></DIV>K. Najafi USA 
<DIV></DIV>K. Sharaf Egypt 
<DIV></DIV>Kadry E. Bedweihy Egypt 
<DIV></DIV>Khalid E. Ismail Egypt 
<DIV></DIV>Khalid ElAyat USA 
<DIV></DIV>M. Amin Saudi Arabia 
<DIV></DIV>M. H. Anis Canada 
<DIV></DIV>M. Declerq Switzerland 
<DIV></DIV>M. Ismail USA 
<DIV></DIV>M. Kamel Canada 
<DIV></DIV>M. Pedram USA 
<DIV></DIV>M. Sawan Canada 
<DIV></DIV>M. Steyaert Belgium 
<DIV></DIV>Magdi Fikry Egypt 
<DIV></DIV>Magdy El-Soudani Egypt 
<DIV></DIV>Mohamed B. Salah Egypt 
<DIV></DIV>Mohamed Elsaid Egypt 
<DIV></DIV>Mohamed I. Elmasry Canada 
<DIV></DIV>Mohamed N. ElDeranie Egypt 
<DIV></DIV>Mohamed N. Salah Egypt 
<DIV></DIV>Mohamed R. ElGhoneimy Egypt 
<DIV></DIV>Mohamed S. Tawfik Egypt 
<DIV></DIV>Mohamed Z. AbdelMagid Egypt 
<DIV></DIV>Mostafa Ghannam Kuwait 
<DIV></DIV>Osman L. ElSayed Egypt 
<DIV></DIV>R. Dutton USA 
<DIV></DIV>R. Howe USA 
<DIV></DIV>R. Newton USA 
<DIV></DIV>R. P. Mertens Belgium 
<DIV></DIV>S. M. Fakhraie Iran 
<DIV></DIV>Safwat Mahrous Egypt 
<DIV></DIV>Salah ElNahway Egypt 
<DIV></DIV>Sameh Said Egypt 
<DIV></DIV>Serag E. D. Habib Egypt 
<DIV></DIV>Sherif Embabi USA 
<DIV></DIV>T. M. A. Shariffadeen Malaysia 
<DIV></DIV>W. Fakhr Egypt 
<DIV></DIV>Y. El-Mansy USA 
<DIV></DIV>Yahia Z. Bahanas Egypt 
<DIV></DIV>
<DIV></DIV>
<DIV></DIV>see web site http://www.icm03.org for more details .. 
<DIV></DIV></div><br clear=all><hr>Tired of spam? Get <a href="http://g.msn.com/8HMOEN/2734??PS=">advanced junk mail protection</a> with MSN 8.</html>

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